Starting with version 2.0, this Driver has a feature for automatically scanning events.

The functionality of automatic scanning uses an internal thread of this Driver to perform a scan for events of a device. Events collected from a device are stored in an internal buffer of this Driver and returned to an application using the Block Tag Automatic Scanning of Events.

The events read by this Block Tag are removed from the internal buffer of this Driver and reported by event, that is, each reading operation of this Block Tag triggers a series of OnRead events. For more information, please check topic I/O Tags Reported by Events on Elipse E3 User's Manual.

The automatic scanning of events is equivalent to the reading of Block Tags Last Events and Last Events of the Backup Buffer, that is, the L and B categories. Readings are always performed using Block Tags with 3 (three) Block Elements. This Driver starts its internal scan by reading the L category. If there is a communication error on a certain channel and slave, that reading is automatically switched to the B category (backup) to avoid loosing events. After the first successful reading of events from the B category, this Driver then returns to search for events from the L category.

Just like when reading Block Tags Last Events and Last Events of the Backup Buffer, this Driver does not support analog events.